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    DC Current Probe and Microwave Probe | SEMISHARE


    DC current probe and microwave probe are among SEMISHARE's comprehensive range of probe accessories.Enhance your wafer testing capabilities.

    SEMISHARE: Pioneering Advanced Probing Solutions for Semiconductor Testing

    In the intricate and ever-evolving landscape of semiconductor technology, the prober machine stands as a testament to human ingenuity and precision engineering. As a leading wafer prober manufacturer with over 14 years of experience, SEMISHARE has been at the forefront of this technological revolution, crafting advanced voltage probes, current probes, DC current probes, DC probes, and microwave probes that ensure the reliability and efficiency of semiconductor devices.

    What is a Prober Machine?

    A prober machine is a sophisticated piece of equipment used in the semiconductor industry to electrically test the integrity and performance of silicon wafers before they are diced into individual chips. This machine plays a crucial role in the manufacturing process, as it helps identify any defects or irregularities that could affect the performance of the final product. SEMISHARE's prober machines are designed to accommodate a wide range of probes, including voltage probes, current probes, and specialized DC current probes.

    How Does a Wafer Prober Work?

    The wafer prober operates by precisely aligning a series of probes with the contact pads on the wafer. These probes, which can be designed for specific functions such as voltage measurement with voltage probes or current measurement with current probes, establish electrical connections that allow for comprehensive testing. SEMISHARE's prober machines are equipped with advanced software and hardware that enable high-speed and high-accuracy testing, ensuring that each wafer meets the industry's stringent standards.

    What is a Probe in Semiconductor?

    In the context of semiconductor testing, a probe is a conductive pin or needle that makes contact with the wafer's test points. SEMISHARE offers a variety of probes, including voltage probes, current probes, DC current probes, DC probes, and microwave probes, each designed to perform specific functions. For instance, a DC current probe is used to measure direct current, while a microwave probe is designed to handle high-frequency signals.

    Understanding Different Types of Probes

    Voltage Probe: A voltage probe is an essential tool in electrical testing, used to measure the potential difference between two points in a circuit. SEMISHARE's voltage probes are designed for high accuracy and minimal circuit loading, ensuring reliable measurements across a wide range of voltages.

    Current Probe: A current probe is used to measure the flow of electric current in a conductor without breaking the circuit. SEMISHARE offers both AC and DC current probes, catering to different testing requirements. The current probe connection is designed for ease of use and reliable measurements.

    DC Current Probe: A DC current probe is specifically designed to measure direct current. These probes use Hall effect sensors or similar technologies to provide accurate measurements of DC current flow. DC current probes work by sensing the magnetic field created by the current flow, allowing for non-intrusive current measurement.

    DC Probe: SEMISHARE's DC probes are versatile tools for a range of DC testing applications. They are designed for durability and consistent performance over extended use, making them ideal for various semiconductor testing scenarios.

    Microwave Probe: In the realm of high-frequency testing, microwave probes are indispensable. These specialized probes are designed to handle signals in the microwave frequency range, typically from 300 MHz to 300 GHz. SEMISHARE's microwave probes ensure accurate testing of high-speed semiconductor devices.

    How Are Silicon Wafers Tested?

    Silicon wafer testing is a meticulous process that involves multiple stages:

    1. Wafer Mounting: The silicon wafer is carefully mounted onto the prober machine's chuck.

    2. Probe Alignment: The prober aligns the probes (which may include voltage probes, current probes, or DC current probes) with the wafer's test points.

    3. Contact Establishment: The probes make contact with the wafer's surface.

    4. Signal Application: Electrical signals are applied through the probes.

    5. Measurement: The wafer's responses are measured and analyzed.

    6. Data Analysis: The collected data is processed to determine the wafer's performance and identify any defects.

    SEMISHARE's prober systems, equipped with advanced voltage probes, current probes, and other specialized probes, are designed to handle this process with exceptional precision, ensuring that every wafer is thoroughly tested.

    The Role of SEMISHARE in Wafer Prober Manufacturing

    SEMISHARE's commitment to innovation is evident in its extensive R&D efforts, with over 15% of costs allocated to research and development. This investment has yielded more than 100 patents, reflecting the company's dedication to creating advanced and reliable prober machines and probes, including state-of-the-art voltage probes, current probes, and DC current probes.

    The company's prober systems are not just limited to a single market but have a global reach, with systems sold in the United States, Britain, Germany, Greece, Australia, Singapore, and beyond. This extensive marketing network is a testament to SEMISHARE's reputation as a dependable wafer prober manufacturer.

    Advanced Probing Solutions

    SEMISHARE offers a comprehensive range of probing solutions to meet diverse testing needs:

    Voltage Probes: SEMISHARE's voltage probes are designed for high-precision voltage measurements. They feature high input impedance to minimize circuit loading and ensure accurate readings across a wide voltage range.

    Current Probes: For current measurements, SEMISHARE provides both AC and DC current probes. These probes use advanced sensing technologies to measure current flow without interrupting the circuit.

    DC Current Probes: Specialized for DC current measurements, these probes offer high accuracy and stability. They are ideal for testing power semiconductor devices and other applications requiring precise DC current measurements.

    DC Probes: SEMISHARE's DC probes are versatile tools for a range of DC testing applications. They are designed for durability and consistent performance over extended use.

    Microwave Probes: For high-frequency testing, SEMISHARE's microwave probes offer exceptional performance. These probes are crucial for testing high-speed semiconductor devices and RF circuits.

    The Kelvin Probe, for instance, is tailored for small signal testing and can operate at high frequencies, ensuring the accuracy of resistance measurements. For high current testing, SEMISHARE offers Large Current Shunt Probes that can handle substantial current loads, ensuring reliable contact with the sample under test.

    The T-4 Series Soft Needle is another example of SEMISHARE's innovative approach to prober machine design. These soft needles are ideal for testing delicate integrated circuit electrodes and are designed to minimize damage to the chip while ensuring a secure connection.

    Specialized Probing Technologies

    Current Injection Probe: This specialized probe is used to inject current into a circuit for testing purposes. It's particularly useful in EMC (Electromagnetic Compatibility) testing and fault analysis.

    DC Current Transducer: SEMISHARE's DC current transducers offer high accuracy in measuring DC currents. They use advanced Hall effect technology to provide precise measurements without physical contact with the current-carrying conductor.

    Microwave Detectors: In addition to microwave probes, SEMISHARE provides microwave detectors for measuring power in microwave frequency ranges. These detectors are crucial in testing and characterizing high-frequency semiconductor devices.

    Company Strengths and Customer Support

    SEMISHARE's 10,000㎡ factory area is a hub of manufacturing excellence, where state-of-the-art equipment and skilled professionals come together to produce top-quality prober machines and probes, including voltage probes, current probes, and DC current probes. The company's R&D center, comprising eight specialized systems, is a powerhouse of innovation, driving the development of new technologies and applications in the field of wafer probing.

    SEMISHARE's customer service is just as impressive as its products. The company offers a full range of support services, including product consultation, customization, delivery, and after-sales service. With a dedicated contact number and email support, customers can easily reach out for assistance or to request a quotation.

    Recent Developments

    SEMISHARE's commitment to industry leadership was recently showcased at the 5th GSIE Global Semiconductor Industry Expo in Chongqing. As one of the representatives of advanced semiconductor testing equipment, SEMISHARE's participation for the third time underscores its position at the forefront of semiconductor testing technology, particularly in the development of cutting-edge voltage probes, current probes, and DC current probes.

    SEMISHARE's prober machines and probing solutions, including its advanced voltage probes, current probes, DC current probes, DC probes, and microwave probes, are more than just tools for semiconductor testing; they are symbols of the company's unwavering commitment to innovation, quality, and customer satisfaction. With a global presence and a product range that caters to diverse testing needs, SEMISHARE is the go-to manufacturer for all your wafer probing requirements.

    For more information about SEMISHARE and its products, including our range of voltage probes, current probes, DC current probes, DC probes, and microwave probes, visit our website at https://www.semishareprober.com/. To discuss your specific needs or to request a quotation, feel free to contact us at sales@semishare.com or call us at 0755-2690 6952 extension 801/804/806/814. Join us in shaping the future of semiconductor testing with our advanced prober machines and probing solutions.

    Panoramica del prodottoDownloadVideo
    Probe

    Standard/Dimensioni

    ST Seires Hard needle

    ST Seires Hard needle

    Specifiche:ST

    Dimensioni:Materiale del tungsteno dell'ago duro

    Caratteristiche:Caratteristiche: L'ago duro della serie ST è una sonda del materiale di tungsteno di diametro 0,020 pollici (0,51 mm) che è stato lavorato elettrochimicamente di precisione in sonde con diametri differenti della punta dell'ago e una lunghezza di 1,5 pollici (38,1 mm). Questa sonda è utilizzata per la maggior parte della misura del punto dell'elettrodo del chip e della misura del punto della linea. L'ago duro della serie ST può essere utilizzato per raschiare o perforare lo strato di passivazione sulla superficie dei chip. Se è selezionata la nichelatura, "NP" verrà aggiunto dopo il modello.

    Kelvin Probe

    Kelvin Probe

    Specifiche:Frequenza di prova 150MHz, perdita migliore di 10fA, capacità <10fF

    Dimensioni:Regular

    Caratteristiche:Adatto per piccoli test di segnale. Sonda Kelvin APT La sonda Kelvin APT è adatta per la prova a quattro fili per ridurre l'influenza della resistenza della linea e della resistenza di contatto sulla prova, garantendo l'accuratezza della prova di resistenza di piccole dimensioni. Inoltre, alcuni test ad alta frequenza, come circa 150M, possono anche utilizzare questo.

    Large Current Shunt Probe

    Large Current Shunt Probe

    Specifiche:Un singolo ago shunt può avere la capacità di 5A CC e la capacità di prova dell'impulso 50A

    Dimensioni:numero personalizzabile di aghi

    Caratteristiche:Adatto per scenari ad alta corrente, consentendo un migliore contatto con i campioni

    T-4 Series Soft Needle

    T-4 Series Soft Needle

    Specifiche:T-4

    Dimensioni:ago morbido

    Caratteristiche:Gli aghi morbidi serie T-4 sono ampiamente utilizzati nella misura del punto delle linee di circuiti integrati, elettrodi o mini elettrodi fatti di FIB (fascio ionico focalizzato). La struttura degli aghi molli serie T-4 adotta aghi di tungsteno di diversi diametri, che devono essere saldati all'asta di ago di rame stagnato. Tra questi, T-4-10 e T-4-22 sono i due modelli che hanno vantaggi nel feedback del cliente, perché il loro diametro dell'ago è più sottile e ha una buona elasticità di flessione, che può ridurre notevolmente i danni agli elettrodi del chip e possono anche garantire un buon contatto con gli elettrodi in alcuni ambienti di vibrazione. L'ago morbido T-4 non è raccomandato per l'uso in nodi sensibili in quanto può causare problemi di carico capacitivo. In questo ambiente, si consiglia di utilizzare la serie Picoprops ad alta impedenza.

    Annex

    For details of the probe specifications, you can download our accessories manual.
    Servizio clienti
    Richiesta di preventivo Richiesta di preventivo
    Numero di contatto

    Numero di contatto

    0755-2690 6952 turn 801/804/806/814

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