DC Current Probe and Microwave Probe | SEMISHARE
DC current probe and microwave probe are among SEMISHARE's comprehensive range of probe accessories.Enhance your wafer testing capabilities.
SEMISHARE: Pioneering Advanced Probing Solutions for Semiconductor Testing
In the intricate and ever-evolving landscape of semiconductor technology, the prober machine stands as a testament to human ingenuity and precision engineering. As a leading wafer prober manufacturer with over 14 years of experience, SEMISHARE has been at the forefront of this technological revolution, crafting advanced voltage probes, current probes, DC current probes, DC probes, and microwave probes that ensure the reliability and efficiency of semiconductor devices.
What is a Prober Machine?
A prober machine is a sophisticated piece of equipment used in the semiconductor industry to electrically test the integrity and performance of silicon wafers before they are diced into individual chips. This machine plays a crucial role in the manufacturing process, as it helps identify any defects or irregularities that could affect the performance of the final product. SEMISHARE's prober machines are designed to accommodate a wide range of probes, including voltage probes, current probes, and specialized DC current probes.
How Does a Wafer Prober Work?
The wafer prober operates by precisely aligning a series of probes with the contact pads on the wafer. These probes, which can be designed for specific functions such as voltage measurement with voltage probes or current measurement with current probes, establish electrical connections that allow for comprehensive testing. SEMISHARE's prober machines are equipped with advanced software and hardware that enable high-speed and high-accuracy testing, ensuring that each wafer meets the industry's stringent standards.
What is a Probe in Semiconductor?
In the context of semiconductor testing, a probe is a conductive pin or needle that makes contact with the wafer's test points. SEMISHARE offers a variety of probes, including voltage probes, current probes, DC current probes, DC probes, and microwave probes, each designed to perform specific functions. For instance, a DC current probe is used to measure direct current, while a microwave probe is designed to handle high-frequency signals.
Understanding Different Types of Probes
Voltage Probe: A voltage probe is an essential tool in electrical testing, used to measure the potential difference between two points in a circuit. SEMISHARE's voltage probes are designed for high accuracy and minimal circuit loading, ensuring reliable measurements across a wide range of voltages.
Current Probe: A current probe is used to measure the flow of electric current in a conductor without breaking the circuit. SEMISHARE offers both AC and DC current probes, catering to different testing requirements. The current probe connection is designed for ease of use and reliable measurements.
DC Current Probe: A DC current probe is specifically designed to measure direct current. These probes use Hall effect sensors or similar technologies to provide accurate measurements of DC current flow. DC current probes work by sensing the magnetic field created by the current flow, allowing for non-intrusive current measurement.
DC Probe: SEMISHARE's DC probes are versatile tools for a range of DC testing applications. They are designed for durability and consistent performance over extended use, making them ideal for various semiconductor testing scenarios.
Microwave Probe: In the realm of high-frequency testing, microwave probes are indispensable. These specialized probes are designed to handle signals in the microwave frequency range, typically from 300 MHz to 300 GHz. SEMISHARE's microwave probes ensure accurate testing of high-speed semiconductor devices.
How Are Silicon Wafers Tested?
Silicon wafer testing is a meticulous process that involves multiple stages:
1. Wafer Mounting: The silicon wafer is carefully mounted onto the prober machine's chuck.
2. Probe Alignment: The prober aligns the probes (which may include voltage probes, current probes, or DC current probes) with the wafer's test points.
3. Contact Establishment: The probes make contact with the wafer's surface.
4. Signal Application: Electrical signals are applied through the probes.
5. Measurement: The wafer's responses are measured and analyzed.
6. Data Analysis: The collected data is processed to determine the wafer's performance and identify any defects.
SEMISHARE's prober systems, equipped with advanced voltage probes, current probes, and other specialized probes, are designed to handle this process with exceptional precision, ensuring that every wafer is thoroughly tested.
The Role of SEMISHARE in Wafer Prober Manufacturing
SEMISHARE's commitment to innovation is evident in its extensive R&D efforts, with over 15% of costs allocated to research and development. This investment has yielded more than 100 patents, reflecting the company's dedication to creating advanced and reliable prober machines and probes, including state-of-the-art voltage probes, current probes, and DC current probes.
The company's prober systems are not just limited to a single market but have a global reach, with systems sold in the United States, Britain, Germany, Greece, Australia, Singapore, and beyond. This extensive marketing network is a testament to SEMISHARE's reputation as a dependable wafer prober manufacturer.
Advanced Probing Solutions
SEMISHARE offers a comprehensive range of probing solutions to meet diverse testing needs:
Voltage Probes: SEMISHARE's voltage probes are designed for high-precision voltage measurements. They feature high input impedance to minimize circuit loading and ensure accurate readings across a wide voltage range.
Current Probes: For current measurements, SEMISHARE provides both AC and DC current probes. These probes use advanced sensing technologies to measure current flow without interrupting the circuit.
DC Current Probes: Specialized for DC current measurements, these probes offer high accuracy and stability. They are ideal for testing power semiconductor devices and other applications requiring precise DC current measurements.
DC Probes: SEMISHARE's DC probes are versatile tools for a range of DC testing applications. They are designed for durability and consistent performance over extended use.
Microwave Probes: For high-frequency testing, SEMISHARE's microwave probes offer exceptional performance. These probes are crucial for testing high-speed semiconductor devices and RF circuits.
The Kelvin Probe, for instance, is tailored for small signal testing and can operate at high frequencies, ensuring the accuracy of resistance measurements. For high current testing, SEMISHARE offers Large Current Shunt Probes that can handle substantial current loads, ensuring reliable contact with the sample under test.
The T-4 Series Soft Needle is another example of SEMISHARE's innovative approach to prober machine design. These soft needles are ideal for testing delicate integrated circuit electrodes and are designed to minimize damage to the chip while ensuring a secure connection.
Specialized Probing Technologies
Current Injection Probe: This specialized probe is used to inject current into a circuit for testing purposes. It's particularly useful in EMC (Electromagnetic Compatibility) testing and fault analysis.
DC Current Transducer: SEMISHARE's DC current transducers offer high accuracy in measuring DC currents. They use advanced Hall effect technology to provide precise measurements without physical contact with the current-carrying conductor.
Microwave Detectors: In addition to microwave probes, SEMISHARE provides microwave detectors for measuring power in microwave frequency ranges. These detectors are crucial in testing and characterizing high-frequency semiconductor devices.
Company Strengths and Customer Support
SEMISHARE's 10,000㎡ factory area is a hub of manufacturing excellence, where state-of-the-art equipment and skilled professionals come together to produce top-quality prober machines and probes, including voltage probes, current probes, and DC current probes. The company's R&D center, comprising eight specialized systems, is a powerhouse of innovation, driving the development of new technologies and applications in the field of wafer probing.
SEMISHARE's customer service is just as impressive as its products. The company offers a full range of support services, including product consultation, customization, delivery, and after-sales service. With a dedicated contact number and email support, customers can easily reach out for assistance or to request a quotation.
Recent Developments
SEMISHARE's commitment to industry leadership was recently showcased at the 5th GSIE Global Semiconductor Industry Expo in Chongqing. As one of the representatives of advanced semiconductor testing equipment, SEMISHARE's participation for the third time underscores its position at the forefront of semiconductor testing technology, particularly in the development of cutting-edge voltage probes, current probes, and DC current probes.
SEMISHARE's prober machines and probing solutions, including its advanced voltage probes, current probes, DC current probes, DC probes, and microwave probes, are more than just tools for semiconductor testing; they are symbols of the company's unwavering commitment to innovation, quality, and customer satisfaction. With a global presence and a product range that caters to diverse testing needs, SEMISHARE is the go-to manufacturer for all your wafer probing requirements.
For more information about SEMISHARE and its products, including our range of voltage probes, current probes, DC current probes, DC probes, and microwave probes, visit our website at https://www.semishareprober.com/. To discuss your specific needs or to request a quotation, feel free to contact us at sales@semishare.com or call us at 0755-2690 6952 extension 801/804/806/814. Join us in shaping the future of semiconductor testing with our advanced prober machines and probing solutions.
