Our website uses cookies provided by us and third parties. Some cookies are necessary for the operation of the website, and you can adjust other cookies at any time, especially those that help us understand the performance of the website, provide you。

I accept
Name:
Phone Number*
Company Name:
mailbox*
Country*
Content:

Test Solution

Semi-Automatic Probe Station Measurement Technology

Semi-Automatic Probe Station Measurement Technology

Semi-Automatic Probe Station and Semiconductor Test Equipment | SEMISHARE

SEMISHARE semi-automatic probe station technology and semiconductor test equipment are designed to deliver high-precision、high efficiency wafer-level testing.

SEMISHARE: Pioneering Advances in Semi Automatic Probe Stations and Semiconductor Test Equipment

In the ever-evolving landscape of semiconductor technology, the demand for precise, efficient, and reliable testing solutions continues to grow exponentially. SEMISHARE, a leader in innovative testing technologies, is at the forefront of this revolution with its cutting-edge semi automatic probe stations and comprehensive semiconductor test equipment offerings.

The Vital Role of Semi Automatic Probe Stations

Semi automatic probe stations play a crucial role in the semiconductor industry, bridging the gap between fully manual and fully automated testing processes. These sophisticated systems offer a perfect balance of user control and automated precision, making them indispensable tools for both research and production environments.

SEMISHARE's semi automatic probe stations are designed to meet the diverse needs of the semiconductor industry, offering:

1. Exceptional stability: Our patented ThreeInoneTM technology ensures unparalleled stability during long test runs, minimizing errors and improving overall test accuracy.

2. Versatile imaging: The integrated ThreeZoomTM microscope allows for seamless observation of 6-inch, 8-inch, and 12-inch wafers without lens switching, significantly enhancing test efficiency.

3. Precision positioning: Advanced stage control systems enable accurate probe placement, even for the most demanding fine-pitch devices.

4. Flexible configuration: Our semi automatic probe stations can be easily customized to accommodate a wide range of test requirements and wafer sizes.

5. User-friendly interface: Intuitive software controls make our semi automatic probe stations accessible to both novice and experienced users.

The Advantages of Semi Automatic Probe Stations

Choosing a semi automatic probe station over fully manual or fully automated systems offers several key benefits:

1. Improved consistency: Semi automatic probe stations reduce the variability associated with manual testing while maintaining the flexibility to handle unique test scenarios.

2. Cost-effectiveness: These systems offer a more affordable alternative to fully automated probe stations, making advanced testing capabilities accessible to a broader range of organizations.

3. Scalability: SEMISHARE's semi automatic probe stations can be easily upgraded as testing needs evolve, protecting your investment in the long term.

4. Ease of use: The semi-automated nature of these systems simplifies the testing process, reducing the learning curve for new operators.

5. Versatility: Our semi automatic probe stations are suitable for a wide range of applications, from R&D to small-scale production testing.

Advancing Semiconductor Test Equipment

Complementing our semi automatic probe stations, SEMISHARE offers a comprehensive suite of semiconductor test equipment designed to meet the industry's most demanding requirements. Our semiconductor test equipment portfolio includes:

1. Parametric testers: High-precision instruments for measuring electrical characteristics of semiconductor devices.

2. RF testers: Specialized equipment for evaluating high-frequency performance of wireless and communication chips.

3. Power device testers: Robust systems capable of handling high voltages and currents for testing power semiconductors.

4. Memory testers: Dedicated equipment for testing various types of memory devices, including DRAM, SRAM, and flash memory.

5. Mixed-signal testers: Versatile systems that can evaluate both analog and digital functionalities of complex ICs.

6. Reliability testers: Equipment designed to assess the long-term performance and durability of semiconductor devices under various stress conditions.

Integrating Semi Automatic Probe Stations with Semiconductor Test Equipment

One of SEMISHARE's key strengths lies in our ability to seamlessly integrate our semi automatic probe stations with our diverse range of semiconductor test equipment. This integration offers several advantages:

1. Streamlined workflow: The compatibility between our semi automatic probe stations and semiconductor test equipment allows for smooth transitions between different testing phases.

2. Comprehensive data analysis: Integrated software platforms enable cohesive data collection and analysis across various test equipment.

3. Customizable test sequences: Users can easily create and modify test flows that leverage the capabilities of both the semi automatic probe station and connected semiconductor test equipment.

4. Space efficiency: Our integrated solutions minimize the footprint required for a complete test setup, optimizing laboratory and production floor space.

5. Simplified training: Consistent user interfaces across our semi automatic probe stations and semiconductor test equipment reduce the learning curve for operators.

Innovative Features of SEMISHARE's Semiconductor Test Equipment

Our semiconductor test equipment is designed with innovation at its core, offering features such as:

1. Multi-site testing capabilities: Increase throughput by testing multiple devices simultaneously.

2. Wide temperature range testing: Evaluate device performance across extreme temperature conditions.

3. Advanced signal integrity: Ensure accurate measurements even for high-speed and sensitive devices.

4. Modular architecture: Easily upgrade or reconfigure test systems as needs change.

5. AI-enhanced test optimization: Leverage machine learning algorithms to optimize test sequences and improve efficiency.

Applications Across the Semiconductor Industry

SEMISHARE's semi automatic probe stations and semiconductor test equipment find applications across various sectors of the semiconductor industry:

1. Research and Development: Our semi automatic probe stations provide the flexibility and precision needed for cutting-edge semiconductor research.

2. Failure Analysis: The high-resolution imaging capabilities of our semi automatic probe stations, combined with our specialized semiconductor test equipment, enable detailed failure analysis and quality control.

3. Production Testing: For small to medium-scale production, our semi automatic probe stations offer an ideal balance of throughput and flexibility.

4. Device Characterization: Our comprehensive semiconductor test equipment suite allows for thorough characterization of devices across various parameters.

5. Reliability Testing: Long-term performance evaluation is made possible through our specialized reliability testing equipment.

Customer Success Story: Nanyang Technological University

The deployment of SEMISHARE's X8 Semi Automatic Probe Station at Nanyang Technological University showcases the versatility and reliability of our equipment in academic research settings. Researchers at the university have leveraged the precision and stability of our semi automatic probe station to advance their studies in emerging semiconductor technologies.

Future Trends in Semi Automatic Probe Stations and Semiconductor Test Equipment

As the semiconductor industry continues to evolve, SEMISHARE remains committed to pushing the boundaries of what's possible in testing technology. Some of the trends we're exploring for future semi automatic probe stations and semiconductor test equipment include:

1. Enhanced automation features: Developing more intelligent automation capabilities while maintaining the flexibility of semi-automatic systems.

2. Improved thermal management: Designing systems capable of more precise temperature control for both high and low-temperature testing.

3. Advanced materials compatibility: Ensuring our semi automatic probe stations and semiconductor test equipment can handle next-generation semiconductor materials.

4. Increased parallelism: Developing systems capable of testing even more sites simultaneously to further improve throughput.

5. Enhanced data analytics: Integrating more powerful data analysis tools to extract deeper insights from test results.

SEMISHARE's Commitment to Advancing Semiconductor Testing

In an industry where precision and reliability are paramount, SEMISHARE's dedication to innovation in semi automatic probe stations and semiconductor test equipment sets us apart. Our comprehensive solutions empower semiconductor manufacturers, researchers, and quality control specialists to push the boundaries of what's possible in chip design and production.

By choosing SEMISHARE as your partner in semiconductor testing, you gain access to:

1. Cutting-edge semi automatic probe stations that offer unparalleled stability and versatility

2. A comprehensive suite of semiconductor test equipment designed to meet diverse testing needs

3. Integrated solutions that streamline your testing workflow and improve overall efficiency

4. Ongoing support and expertise from our team of experienced engineers and technicians

5. A commitment to continuous innovation, ensuring your testing capabilities remain at the forefront of technology

Whether you're developing next-generation processors, advanced memory devices, or cutting-edge sensors, SEMISHARE has the semi automatic probe stations and semiconductor test equipment you need to ensure the quality, reliability, and performance of your innovations.

Discover how SEMISHARE can elevate your semiconductor testing capabilities. Visit our website at https://www.semishareprober.com/ to explore our full range of semi automatic probe stations and semiconductor test equipment, and to learn how we can tailor our solutions to meet your specific testing needs.

Join us in shaping the future of semiconductor technology. With SEMISHARE's advanced semi automatic probe stations and semiconductor test equipment, you'll be well-equipped to meet the challenges of today's semiconductor industry and poised to seize the opportunities of tomorrow.

 
Technical Background

With the rapid development of China's semiconductor technology, multiple 12-inch wafer plant and the establishment of laboratories, gradually appeared to 12-inch wafer testing Probe needs to improve, now 12-inch wafer Prober mostly depends on import equipment , and presents the status of the demand greater than supply, so the domestic is an urgent need to research and development of China's autonomous 12-inch wafer testing equipment, to solve the dilemma in the only rely on foreign imports.

Face the Challenge

The existing semiconductor chip test probe stations in China are prone to shake after a long time of work. During the operation of the probe, the probe station is unstable and prone to test errors, which brings inconvenience to users.


Technical Summary

Technology Name: A semi-automatic wafer probe bench Test measurement technology (ThreeInoneTM technology)

Patent Type: Invention Technology Patent

Patent Number: 201910551072.8

ThreeInoneTM technology provides a probe bench with high stability and semi-automatic wafer testing equipment. Through the stable structure of low center of gravity, the problem that the equipment is easy to shake and affect the test accuracy in wafer testing is solved, and the high stability performance of probe bench is guaranteed finally, so that the test can reach the high precision.

The equipment is also equipped with the industry leading ThreeZoomTM microscope. For compatibility with 6 inch, 8 inch and 12 inch wafers, the imaging effect of ThreeZoomTM can be observed in the image without lens and multiplier switching. Meanwhile, the rendering of ThreeZoomTM can satisfy the wafer and most samples in the laboratory, with high compatibility, and also improve the efficiency of each test.


Application Cases

  • Nanyang Technological University
  • SEMISHARE X8  Semi-Automatic Probe Station


© 2023 SEMISHARE CO., LTD. All Rights Reserved.粤ICP备19119103号