The three-day 25th China International Optoelectronic Exposition（CIOE) concluded successfully on September 13 at the Shenzhen Bao'an International Convention and Exhibition Center. SEMISHARE showcased advanced wafer testing solutions（ including the A Series fully automatic probe stations, the X Series semi-automatic probe stations, and the H Series manual probe stations）, attracting a lot of attention and support from industry partner and customers. (Click the video below to watch for more details.)
INTERVIEW-SEMISHARE ADVANCED PROBER
The SEMISHARE A Series is a high-precision, fully automatic testing device with a probing accuracy of up to ±2μm. It's mainly used for high-volume WAT and CP testing and is versatile enough for a variety of wafer testing, including memory, SOC, digital circuits, analog circuits, power devices, RF devices, and discrete components.
we offer custom solutions for a special needs, like board-level packaging, frame wafer testing, dual-port testing, electric needle holder testing, and four-wire method testing. We've got plenty of successful cases in these areas.
The X-Series is a semi-automatic probe station that combines testing functions for electrical, optical, and microwave measurements, with precision up to ±1μm. It offers a variety of testing environments, making it both flexible and easy to use. This makes it especially well-suited for labs and small to medium-sized production settings. It supports a range of applications, including DC parameter testing, high-power device testing, RF testing, optoelectronic testing, failure analysis, 1/f noise testing, silicon photonics testing, WLR tests, VCSEL testing, and blue film testing.
For research-focused customers，H Series manual wafer probe station features excellent mechanical performance and testing capabilities, which is packed with chuck movement technology that meets customers' demands for efficient testing of whole wafers. It also features a gearless nut-driven moving platform that allows for high-speed positioning and precise micrometric adjustments, with an accuracy down to 1μm.
For more complex applications, like extreme temperatures, electromagnetic interference, or superconducting material testing, we offer a range of specialized products such as high/low-temperature probe stations and vacuum high/low-temperature probe stations. Feel free to reach out and discuss your needs with us!
It was a great success, and our journey goes on!
We would like to express our heartfelt gratitude to every client and partner who visited our booth. Your trust and support for SEMISHARE are invaluable! Each interaction and recognition inspires us to keep moving forward.
Looking ahead, SEMISHARE will continue to embrace innovation, offering advanced wafer probe station testing solutions that deliver high precision, efficiency, and stability to support industry development and reduce manufacturing costs. Our journey is far from over, and we eagerly anticipate partnering with you to create and celebrate many more exciting moments together!
