On November 12, the SEMICON Europa 2024 semiconductor exhibition grandly opened in Munich, Germany. As a leading manufacturer of advanced wafer probe stations, SEMISHARE participated in the event, unveiling the V-series, the next-generation high-performance probe station. Through this groundbreaking launch, they demonstrated the infinite possibilities for innovation in wafer testing and made a strong response to the evolving demands of the semiconductor testing market.
Mr. Liu Shiwen, CEO of SEMISHARE, along with the top engineering team, appeared at the exhibition, offering visitors an immersive experience with SEMISHARE' cutting-edge wafer testing technology and engaging in insightful industry discussions. The booth saw a continuous flow of attendees, and the V-series probe station quickly gained widespread acclaim for its core features, including high testing flexibility, exceptional electrical test accuracy, industrial aesthetics, and compact design. These attributes earned it high praise and strong interest from numerous professionals, with enthusiastic feedback pouring in and on-site pre-sales kicking off in full swing.
SEMISHARE V SERIES NEXT-GENERATION HIGH PERFORMANCE PROBE STATION
As semiconductor technology advances toward finer and more complex processes, research institutions face increasing demands for diverse testing, while semiconductor packaging and testing manufacturers are challenged to improve efficiency and reduce costs. The SEMISHARE V-series probe station not only inherits the functionality and ease of operation of the popular X-series semi-automatic probe station but also supports the addition of a loader for seamless manual and automatic wafer handling, offering greater testing flexibility for research institutions and packaging manufacturers to tackle complex testing tasks.
With its exceptional low leakage current capabilities, the V-series can achieve a chuck leakage current of under 400 fA, enabling the system to measure even lower-level leakage current parameters, which directly impacts the quality and reliability of semiconductor devices.
The test results for the V8 chuck leakage current
In terms of design, the V-series probe station marks a significant breakthrough compared to the X-series. Its size and weight have been reduced to half, and the compact design greatly minimizes the footprint. This improvement allows it to fit seamlessly into space-constrained research labs or compact production floors, perfectly aligning with the semiconductor industry's growing need for efficient space utilization, helping companies reduce costs and increase efficiency.