Using prober semiconductor material qualitative analysis in the precise measurement of the main parameters, an integral test probe the application of several common types of probes: general DC active probe and microwave coaxial DC probe probes in the whole process of application, the probe surface with the sample (s) will meet with dust or air oxidation layer, the application will harm data to test the credibility of the but again subscription fee, very is microwave probe, will greatly increase the user consumption of product cost this again, we were taught three ways, can be convenient to remove the obstinate stains on the probe, could increase the probe of consumption goods.
1. Brush cleaning
Application: 5 m probe, microwave probe. Discomfort for soft needles with needle diameter below 5 m.
Take a piece of A4 paper and break off the long thin strips, preferably the long thin triangular shape (about 5cm high up and down). Install the probe to be cleaned on the probe fixture and place it under the optical microscope (the volume microscope can be used to make the number too large for practical operation), use the strip tip as the brush, and brush the dirt off the probe tip slowly.
2. Pressing needle cleaning method
Application: all types of probes, dust relatively close to the top of the probe condition.
3. Ultrasonic cleaning method
Application: All probes.